A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices ...

With more than 20% of organizations deploying updates multiple times per day, according to my company's study, the complexity of test authoring has grown significantly. Test authoring is the process ...